IEEE Transactions on Computers
Optimal clock skew scheduling tolerant to process variations
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Cycle time and slack optimization for VLSI-chips
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Statistical timing analysis using bounds and selective enumeration
Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems
Delay Testing for Non-Robust Untestable Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Selection of Potentially Testable Path Delay Faults for Test Generation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Faster maximum and minimum mean cycle algorithms for system-performance analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Physical aware clock skew rescheduling
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Proceedings of the 45th annual Design Automation Conference
Online clock skew tuning for timing speculation
Proceedings of the International Conference on Computer-Aided Design
Clock skew scheduling for timing speculation
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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This article proposes clock skew scheduling as a tool to address causes of performance-related circuit yield loss. It is an interesting example of how managing circuit-level parameters can have a direct impact on yield metrics and, therefore, a clear example of the direction of DFM research.