Yield-Driven, False-Path-Aware Clock Skew Scheduling

  • Authors:
  • Jeng-Liang Tsai;Dong Hyun Baik;Charlie Chung-Ping Chen;Kewal K. Saluja

  • Affiliations:
  • University of Wisconsin-Madison;University of Wisconsin-Madison;University of Wisconsin-Madison;University of Wisconsin-Madison

  • Venue:
  • IEEE Design & Test
  • Year:
  • 2005

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Abstract

This article proposes clock skew scheduling as a tool to address causes of performance-related circuit yield loss. It is an interesting example of how managing circuit-level parameters can have a direct impact on yield metrics and, therefore, a clear example of the direction of DFM research.