The coupling model for function and delay faults

Authors:
Joonhwan Yi;John P. Hayes
Affiliations:
Telecommunication Research Center, Samsung Electronics Corporation, Suwon, Kyunggi-Do, Republic of Korea;Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2005

Citing 15
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Abstract

We propose a high-level fault model, the coupling fault (CF) model, that aims to cover both functional and timing faults in an integrated way. The basic properties of CFs and the corresponding tests are analyzed, focusing on their relationship with other fault models and their test requirements. A test generation program COTEGE for CFs is presented. Experiments with COTEGE are described which show that (reduced) coupling test sets can efficiently cover standard stuck-at-0/1 faults in a variety of different realizations. The corresponding coupling delay tests detect all robust path delay faults in any realization of a logic function.