Improving Transition Delay Test Using a Hybrid Method

Authors:
Nisar Ahmed;Mohammad Tehranipoor
Affiliations:
University of Connecticut;University of Connecticut
Venue:
IEEE Design & Test
Year:
2006

Citing 9
Cited 3

Too much delay fault coverage is a bad thing

Proceedings of the IEEE International Test Conference 2001
SCOAP: Sandia controllability/observability analysis program

DAC '80 Proceedings of the 17th Design Automation Conference
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set

VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Scan-Based Transition Fault Testing " Implementation and Low Cost Test Challenges

ITC '02 Proceedings of the 2002 IEEE International Test Conference
High-Frequency, At-Speed Scan Testing

IEEE Design & Test
Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets

Proceedings of the conference on Design, automation and test in Europe - Volume 2
Layout-Aware Scan Chain Synthesis for Improved Path Delay Fault Coverage

Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage

VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
At-Speed Transition Fault Testing With Low Speed Scan Enable

VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test

Using launch-on-capture for testing BIST designs containing synchronous and asynchronous clock domains

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors

Journal of Electronic Testing: Theory and Applications
Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Quantified Score

Hi-index	0.00

Visualization

Abstract

Structured delay test using scan transition tests is becoming commonplace. But high coverage andcompact tests can still be elusive in some situations. The authors propose a novel techniquecombining the cost-effectiveness of launch-from-capture test with the coverage/pattern volumeadvantages of launch-from-shift.