A two moment RC delay metric for performance optimization
ISPD '00 Proceedings of the 2000 international symposium on Physical design
On switch factor based analysis of coupled RC interconnects
Proceedings of the 37th Annual Design Automation Conference
TACO: timing analysis with coupling
Proceedings of the 37th Annual Design Automation Conference
Fast statistical timing analysis by probabilistic event propagation
Proceedings of the 38th annual Design Automation Conference
An "effective" capacitance based delay metric for RC interconnect
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Specification-Driven Test Design for Analog Circuits
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Timing Yield Estimation from Static Timing Analysis
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor
ICCD '03 Proceedings of the 21st International Conference on Computer Design
A Sensitivity Based Approach to Analyzing Signal Delay Uncertainty of Coupled Interconnects
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
STAC: statistical timing analysis with correlation
Proceedings of the 41st annual Design Automation Conference
A unified framework for statistical timing analysis with coupling and multiple input switching
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Critical path selection for delay fault testing based upon a statistical timing model
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Modeling crosstalk in statistical static timing analysis
Proceedings of the 45th annual Design Automation Conference
Critical Path Selection for Delay Testing Considering Coupling Noise
Journal of Electronic Testing: Theory and Applications
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Accurately estimating critical path delays is extremely important for yield optimization and for path selection in delay testing. It is well known that dynamic effects such ascoupling noise can significantly affect critical path delays. In traditional static timing analysis, the coupling effect isincorporated by estimating the switching window overlaps between aggressor and victim and then assuming a constant (worst case) coupling factor if any overlap is present. However in path based statistical timing analysis, using a constant coupling factor can overestimate the mean delay while under estimating the delay variance. In this paper, we propose a technique to estimate the dynamic variation in pathdelay caused by coupling noise. We treat the effective coupling capacitance as a random variable that varies as a function of the relative signal arrival times between victim andaggressor nodes. A modeling technique to estimate the capacitance variation is shown and a framework that gives therelative signal arrival time distribution at the victim nodesis developed.