Conjugate conflict continuation graphs for multi-layer constrained via minimization

  • Authors:
  • Rung-Bin Lin;Shu-Yu Chen

  • Affiliations:
  • Department of Computer Science and Engineering, Yuan Ze University, 135 Yuan-Tung Road, Chung-Li 320, Taiwan;Department of Computer Science and Engineering, Yuan Ze University, 135 Yuan-Tung Road, Chung-Li 320, Taiwan

  • Venue:
  • Information Sciences: an International Journal
  • Year:
  • 2007

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Abstract

A graph model for describing the relationships among wire segments is crucial to constrained via minimization (CVM) in a VLSI design. In this paper we present a new graph model, called the conjugate conflict continuation graph, for multi-layer CVM with stacked vias. This graph model eases the handling of stacked via problems. An integer linear programming (ILP) formulation and a simulated annealing (SA) algorithm based on this graph model are developed to solve multi-layer CVM. The ILP model is too complicated to solve efficiently. The SA algorithm on average achieves 6.4% via reduction for layouts obtained using a commercial tool under a set of practical constraints in which the metal wires (including pins) used in cell layouts, power rails and rings, and clock routing are treated as obstacles or fixed-layer objects to a multi-layer CVM.