Computer
Detection oF Pattern-Sensitive Faults in Random-Access Memories
IEEE Transactions on Computers
An Algorithm for Testing Random Access Memories
IEEE Transactions on Computers
Efficient Algorithms for Testing Semiconductor Random-Access Memories
IEEE Transactions on Computers
An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories
IEEE Transactions on Computers
Built-In Testing of Memory Using an On-Chip Compact Testing Scheme
IEEE Transactions on Computers
Disturb Neighborhood Pattern Sensitive Fault
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A Graph Model for Pattern-Sensitive Faults in Random Access Memories
IEEE Transactions on Computers
Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
International Journal of Applied Mathematics and Computer Science - Selected Problems of Computer Science and Control
Built-in testing of memory using on-chip compact testing scheme
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Analysis of multibackground memory testing techniques
International Journal of Applied Mathematics and Computer Science - Computational Intelligence in Modern Control Systems
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The design of minimum-length test sequences for pattern sensitivity in random-access memory (RAM) arrays is examined. The single pattern-sensitive fault (SPSF) model is used in which operations addressed to at most one memory cell are allowed to be faulty at any time. The influence of an SPSF affecting cell Ci is restricted to a fixed set of cells called the neighborhood of Ci. A new method is presented for efficiently generating the sequence of writes required in an SPSF test. This method yields optimal sequences for a useful class of neighborhoods called tiling neighborhoods. It is observed that RAM neighborhoods can be interpreted as polyominoes. A general procedure is given for constructing an SPSF test containing the minimum number of writes but a nonminimum number of reads. The difficult problem of minimizing the number of reads in an SPSF test is investigated for the 2-cell memory M2. A test of length 36 for M2 is derived which is optimal under certain reasonable restrictions. It is demonstrated that minimum-length SPSF tests can be inherently asymmetric.