Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
Can recursive bisection alone produce routable placements?
Proceedings of the 37th Annual Design Automation Conference
Toward a systematic-variation aware timing methodology
Proceedings of the 41st annual Design Automation Conference
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
A general framework for accurate statistical timing analysis considering correlations
Proceedings of the 42nd annual Design Automation Conference
Statistical delay computation considering spatial correlations
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Projection-based performance modeling for inter/intra-die variations
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Refined statistical static timing analysis through
Proceedings of the 43rd annual Design Automation Conference
A framework for statistical timing analysis using non-linear delay and slew models
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
A general framework for spatial correlation modeling in VLSI design
Proceedings of the 44th annual Design Automation Conference
Delaunay refinement algorithms for triangular mesh generation
Computational Geometry: Theory and Applications
Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Analysis and verification of power grids considering process-induced leakage-current variations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Robust Extraction of Spatial Correlation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Practical, fast Monte Carlo statistical static timing analysis: why and how
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Proceedings of the 47th Design Automation Conference
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Intra-die manufacturing variations are unavoidable in nanoscale processes. These variations often exhibit strong spatial correlation. Standard grid-based models assume model parameters (grid-size, regularity) in an ad hoc manner and can have high measurement cost. The random field model overcomes these issues. However, no general algorithm has been proposed for the practical use of this model in statistical CAD tools. In this paper, we propose a robust and efficient numerical method, based on the Galerkin technique and Karhunen Loéve Expansion, that enables effective use of the model. We test the effectiveness of the technique using a Monte Carlo-based Statistical Static Timing Analysis algorithm, and see errors less than 0.7%, while reducing the number of random variables from thousands to 25, resulting in speedups of up to 100x.