Efficient spare allocation in reconfigurable arrays
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
A Built-In Self-Repair Analyzer (CRESTA) for embedded DRAMs
ITC '00 Proceedings of the 2000 IEEE International Test Conference
SRAM Leakage Suppression by Minimizing Standby Supply Voltage
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
A Feasibility Study of Subthreshold SRAM Across Technology Generations
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Statistical design and optimization of SRAM cell for yield enhancement
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Variability in sub-100nm SRAM designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Analytical modeling of SRAM dynamic stability
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
ETS '07 Proceedings of the 12th IEEE European Test Symposium
The impact of random device variation on SRAM cell stability in sub-90-nm CMOS technologies
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Row/column redundancy to reduce SRAM leakage in presence of random within-die delay variation
Proceedings of the 13th international symposium on Low power electronics and design
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this work, we are the first to consider the optimization of sub-threshold stand-by VDD while simultaneously considering memory yield and redundant row/column usage. We propose a fast, optimal fault-repair analysis framework that is 200--600% faster than previous works and show that leakage can be reduced 10--14% using redundancy without sacrificing yield.