Characterization of the worst-case current waveform excitations in general RLC-model power grid analysis

  • Authors:
  • Nestor Evmorfopoulos;Maria-Aikaterini Rammou;George Stamoulis;John Moondanos

  • Affiliations:
  • University of Thessaly, Greece;University of Thessaly, Greece;University of Thessaly, Greece;University of Thessaly, Greece

  • Venue:
  • Proceedings of the International Conference on Computer-Aided Design
  • Year:
  • 2010

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Abstract

Validating the robustness of power distribution in modern IC design is a crucial but very difficult problem, due to the vast number of possible working modes and the high operating frequencies which necessitate the modeling of power grid as a general RLC network. In this paper we provide a characterization of the worst-case current waveform excitations that produce the maximum voltage drop among all possible working modes of the IC. In addition, we give a practical methodology to estimate these worst-case excitations on the basis of a sample of the excitation space acquired via plain circuit simulation. In the course of characterizing the worst-case excitations we also establish that the voltage drop function for RLC grid models has nonnegative coefficients, which has been an open problem so far.