Architecture and design flow for a highly efficient structured ASIC

  • Authors:
  • Man-Ho Ho;Yan-Qing Ai;Thomas Chun-Pong Chau;Steve C. L. Yuen;Chiu-Sing Choy;Philip H. W. Leong;Kong-Pang Pun

  • Affiliations:
  • Department of Electronic Engineering, Chinese University of Hong Kong, Shatin, Hong Kong;Department of Electronic Engineering, Chinese University of Hong Kong, Shatin, Hong Kong;Department of Computing, Imperial College London, London, UK;Electrical and Mechanical Services Department, Government of the Hong Kong Special Administrative Region, Hong Kong;Department of Electronic Engineering, Chinese University of Hong Kong, Shatin, Hong Kong;School of Electrical and Information Engineering, University of Sydney, Sydney, Australia;Department of Electronic Engineering, Chinese University of Hong Kong, Shatin, Hong Kong

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Year:
  • 2013

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Abstract

As fabrication process technology continues to advance, mask set costs have become prohibitively expensive. Structured application specific integrated circuits (sASICs) offer a middle ground in price and performance between ASICs and field-programmable gate arrays (FPGAs) by sharing masks across different designs. In this paper, two sASIC architectures are proposed, the first being based on three-input lookup-tables, and the second on AOI22 gates. The sASICs are programmed using a standard-cell compatible design flow. They are customized using a minimum of three masks, i.e., two metals and one via. The area and delay of the sASIC are compared with ASICs and FPGAs. Results over a set of benchmark circuits show that our AOI22-based sASIC had an average of 1.76×/1.41× increase in area/delay compared to ASICs, a considerable improvement compared with the 26.56×/5.09× increase for FPGAs. This is, to the best of our knowledge, the best performance reported in the literature for a practical sASIC. A prototype using the sASIC was fabricated using a universal machine control 0.13-µm mixed-mode/RF process. It was fully verified using scan and functional tests, and used in a demonstration system.