Layout compaction for yield optimization via critical area minimization

Authors:
Youcef Bourai;C.-J. Richard Shi
Affiliations:
Electrical Engineering Department, University of Washington Box 352500, Seattle, Washington;Electrical Engineering Department, University of Washington Box 352500, Seattle, Washington
Venue:
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Year:
2000

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