A mixed-mode BIST scheme based on folding compression

Authors:
Liang Huaguo;Sybille Hellebrand;Hans-Joachim Wunderlich
Affiliations:
Department of Computer and Information, Hefei University of Technology, Hefei 230009, P.R. China;Institute of Applied Computer Science, University of Innsbruck, Austria;Institute of Computer Science, University of Stuttgart, Germany
Venue:
Journal of Computer Science and Technology
Year:
2002

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Abstract

In this paper a new scheme for mixed mode scan-based BIST is presented with complete fault coverage, and some new concepts of folding set and computing are introduced. This scheme applies single feedback polynomial of LFSR for generating pseudo-random patterns, as well as for compressing and extending seeds of folding sets and an LFSR, where we encode seed of folding set as an initial seed of LFSR. Moreover these new techniques are 100% compatible with scan design. Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFSRs.