Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms

  • Authors:
  • Johan Karlsson;Peter Liden;Peter Dahlgren;Rolf Johansson;Ulf Gunneflo

  • Affiliations:
  • -;-;-;-;-

  • Venue:
  • IEEE Micro
  • Year:
  • 1994

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Abstract

Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.