Using ILA Testing for BIST in FPGAs

  • Authors:
  • Charles E. Stroud;Eric Lee;Srinivasa Konala;Miron Abramovici

  • Affiliations:
  • -;-;-;-

  • Venue:
  • Proceedings of the IEEE International Test Conference on Test and Design Validity
  • Year:
  • 1996

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Abstract