The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
Journal of Electronic Testing: Theory and Applications
Design for Debug: Catching Design Errors in Digital Chips
IEEE Design & Test
Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips
Journal of Electronic Testing: Theory and Applications
Wrapper Design for Testing IP Cores with Multiple Clock Domains
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Test Infrastructure Design for the Nexperia" Home Platform PNX8550 System Chip
Proceedings of the conference on Design, automation and test in Europe - Volume 3
Automatic generation of breakpoint hardware for silicon debug
Proceedings of the 41st annual Design Automation Conference
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Multi-frequency wrapper design and optimization for embedded cores under average power constraints
Proceedings of the 42nd annual Design Automation Conference
An event-based monitoring service for networks on chip
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Visibility enhancement for silicon debug
Proceedings of the 43rd annual Design Automation Conference
Modular and rapid testing of SOCs with unwrapped logic blocks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Interconnection fabric design for tracing signals in post-silicon validation
Proceedings of the 46th Annual Design Automation Conference
On signal tracing in post-silicon validation
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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