Design topology aware physical metrics for placement analysis

  • Authors:
  • Shyam Ramji;Nagu R. Dhanwada

  • Affiliations:
  • IBM Microelectronics, Hopewell Junction, NY;IBM Microelectronics, Hopewell Junction, NY

  • Venue:
  • Proceedings of the 13th ACM Great Lakes symposium on VLSI
  • Year:
  • 2003

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Abstract

Traditionally placement evaluation metrics have been based on wirelength and congestion measures and are independent of the logic network topology. However, the actual timing measure, which is used in a design closure loop, is path-based and dependent on the network topology. In this paper, we propose a design-topology aware metric that encapsulates the structural property of the circuit and physical goodness of the given placement. We present such a metric which is based on path monotonicity and an efficient method to compute this measure for a given placement. This method involves abstract path generation, clustering based region refinement and physical monotonicity analysis. Experimental results on real industry designs, using a commercial strength design closure flow, establish the usefulness of this metric in predicting the quality of a given placement with respect to design timing closure.