TranGen: a SAT-based ATPG for path-oriented transition faults
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Functions for Quality Transition Fault Tests
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Test set enhancement for quality transition faults using function-based methods
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Quality Transition Fault Tests Suitable for Small Delay Defects
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
A flexible and scalable methodology for GHz-speed structural test
Proceedings of the 43rd annual Design Automation Conference
Estimation of delay test quality and its application to test generation
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Transition path delay faults: a new path delay fault model for small and large delay defects
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
State persistence: a property for guiding test generation
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Deterministic broadside test generation for transition path delay faults
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Recursive pseudo-exhaustive two-pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Path selection for transition path delay faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hazard-based detection conditions for improved transition path delay fault coverage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Generation of mixed test sets for transition faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Broadside and skewed-load tests under primary input constraints
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.00 |
In this work we propose a path-oriented test generationprocedure called POTENT to generate high quality tests fortransition faults. Both weak non-robust and strong non-robusttests can be generated by POTENT. We classify transition faulttests into six types according to their activation and propagationmethods. The basic idea of POTENT is to test a transition faultalong a longest testable path passing through the fault site. Fortransition faults that are activated or propagated through multi-paths,heuristics are proposed to maximize the propagationdelay of the target fault. We also propose an efficient method toevaluate the quality of a given transition fault test set.Experimental results show that POTENT generates higherquality transition fault test sets than the conventional testgeneration method.