ITC '00 Proceedings of the 2000 IEEE International Test Conference
Stuck-Fault Tests vs. Actual Defects
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Method Evaluation Experiments & Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Rapid-Response Temperature Control Provides New Defect Screening Opportunities
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Testing for Resistive Opens and Stuck Opens
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings
IEEE Design & Test
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
Journal of Electronic Testing: Theory and Applications
Detection of Temperature Sensitive Defects Using ZTC
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
SRAM delay fault modeling and test algorithm development
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Testing for Resistive Shorts in FPGA Interconnects
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Design-for-test techniques for opens in undetected branches in CMOS latches and flip-flops
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Small-delay defect detection in the presence of process variations
Microelectronics Journal
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Delay defects can escape detection during the normal production test flow; particularly if they do not affect any of the long paths included in the test flow. Some delay defects can have their delay increased, making them easier to detect, by carrying out the test with a very low supply voltage (VLV testing). However, VLV testing is not effective for delay defects caused by high resistance interconnects. This paper presents a screening technique for such defects. This technique, cold testing, relies on carrying out the test at low temperature. One particular type of defect, silicide open, is analyzed and experimental data is presented to demonstrate the effectiveness of cold testing.