A method for generating weighted random test pattern
IBM Journal of Research and Development
IEEE Transactions on Computers - Special issue on fault-tolerant computing
STARBIST: scan autocorrelated random pattern generation
DAC '97 Proceedings of the 34th annual Design Automation Conference
A hybrid algorithm for test point selection for scan-based BIST
DAC '97 Proceedings of the 34th annual Design Automation Conference
Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Constructive Multi-Phase Test Point Insertion for Scan-Based BIST
Proceedings of the IEEE International Test Conference on Test and Design Validity
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers
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This paper presents an improved scan-based BISTscheme which achieves very high fault coverage withoutany modification of the mission logic, i.e. no test pointinsertion, no test data to store and very simple BIST hardwarewhich does not depend on the size of the circuit. Theapproach utilizes scan order and its polarity in scan synthesis,effectively converting it into a ROM encoding a fewtest vectors which serve as centers of clusters from whichthe other vectors are derived by complementing at randomtheir coordinates. The proposed method successfully teststhe random pattern resistant faults, which is the major problemof traditional LFSR-based BIST, with lower hardwarecost and more efficient algorithm than previous one. Experimentalresults demonstrate that a very high fault coveragecan be achieved with much smaller test set than other pseudorandompattern generation methods published so far.