On Evaluating and Optimizing Weights for Weighted Random Pattern Testing
IEEE Transactions on Computers
Efficient random testing with global weights
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Algorithms to compute bridging fault coverage of IDDQ test sets
ACM Transactions on Design Automation of Electronic Systems (TODAES)
STARBIST: scan autocorrelated random pattern generation
DAC '97 Proceedings of the 34th annual Design Automation Conference
Distributed Generation of Weighted Random Patterns
IEEE Transactions on Computers
A Unified DFT Approach for BIST and External Test
Journal of Electronic Testing: Theory and Applications
Deterministic Pattern Generation for Weighted Random Pattern Testing
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Low Hardware Overhead Scan Based 3-Weight Weighted Random BIST
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Scan Encoded Test Pattern Generation for BIST
ITC '97 Proceedings of the 1997 IEEE International Test Conference
On Using Machine Learning for Logic BIST
ITC '97 Proceedings of the 1997 IEEE International Test Conference
LT-RTPG: A New Test-Per-Scan BIST TPG for Low Heat Dissipation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A BIST Pattern Generator Design for Near-Perfect Fault Coverage
IEEE Transactions on Computers
Logic BIST Using Constrained Scan Cells
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Design of an efficient weighteld random pattern generation system
ITC'94 Proceedings of the 1994 international conference on Test
Fixed-biased pseudorandom built-in self-test for random pattern resistant circuits
ITC'94 Proceedings of the 1994 international conference on Test
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