Defects and Faults in Quantum Cellular Automata at Nano Scale

Authors:
Mehdi Baradaran Tahoori;Mariam Momenzadeh;Jing Huang;Fabrizio Lombardi
Affiliations:
-;-;-;-
Venue:
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Year:
2004

Citing 1
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Abstract

There has been considerable research on quantum dotcellular automata (QCA) as a new computing schemein the nano-scale regimes. The basic logic element ofthis technology is majority voter. In this paper, a detailedsimulation-based characterization of QCA defectsand study of their effects at logic-level are presented.Testing of these devices is investigated and compared withconventional CMOS-based designs. Unique testing featuresof designs based on this technology are presented andinteresting properties have been identified.