Theory and Design Switching Circ
Theory and Design Switching Circ
Elements of discrete mathematics (McGraw-Hill computer science series)
Elements of discrete mathematics (McGraw-Hill computer science series)
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers
Design for Testability A Survey
IEEE Transactions on Computers
Design of Diagnosable Sequential Machines Utilizing Extra Outputs
IEEE Transactions on Computers
Detection oF Pattern-Sensitive Faults in Random-Access Memories
IEEE Transactions on Computers
IEEE Transactions on Computers
Easily Testable Sequential Machines with Extra Inputs
IEEE Transactions on Computers
Fault detecting experiments for sequential circuits
SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
Testable Design of Single-Output Sequential Machines Using Checking Experiments
IEEE Transactions on Computers
An Alternative to Scan Design Methods for Sequential Machines
IEEE Transactions on Computers - The MIT Press scientific computation series
Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Signature Testing of Sequential Machines
IEEE Transactions on Computers
Pseudo-exhaustive testing of sequential machines using signature analysis
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
A technique for making asynchronous sequential circuits readily testable
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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