Thermal-driven analog placement considering device matching

  • Authors:
  • Po-Hung Lin;Hongbo Zhang;Martin D. F. Wong;Yao-Wen Chang

  • Affiliations:
  • National Taiwan University, Taipei, Taiwan;University of Illinois at Urbana-Champaign, IL;University of Illinois at Urbana-Champaign, IL;National Taiwan University, Taipei, Taiwan

  • Venue:
  • Proceedings of the 46th Annual Design Automation Conference
  • Year:
  • 2009

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Abstract

With the thermal effect, improper analog placements may degrade circuit performance because the thermal impact from power devices can affect electrical characteristics of the thermally-sensitive devices. There is not much previous work that considers the desired placement configuration between power and thermally-sensitive devices for a better thermal profile to reduce the thermally-induced mismatches. In this paper, we first introduce the properties of a desired thermal profile for better thermal matching of the matched devices. We then propose a thermal-driven analog placement methodology to achieve the desired thermal profile and to consider the best device matching under the thermal profile while satisfying the symmetry and the common-centroid constraints. Experimental results based on real analog circuits show that our approach can achieve the best analog circuit performance/accuracy with the least impact due to the thermal gradient, among existing works.