A hierarchical approach test vector generation
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
A hierarchical test generation methodology for digital circuits
Journal of Electronic Testing: Theory and Applications
Speed up of test generation using high-level primitives
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Contest: a concurrent test generator for sequential circuits
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
A comparative study of design for testability methods using high-level and gate-level descriptions
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
A Hierarchical Test Generation Approach for Large Controllers
IEEE Transactions on Computers
Test Synthesis with Alternative Graphs
IEEE Design & Test
MUSTC-Testing: Multi-Stage-Combinational Test scheduling at the Register-Transfer Level
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
1.1 Test methodology for embedded cores which protects intellectual property
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A Novel Functional Test Generation Method for Processors using Commercial ATPG
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Coverage driven high-level test generation using a polynomial model of sequential circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A hierarchical environment for interactive test engineering
ITC'94 Proceedings of the 1994 international conference on Test
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