Shielding effect of on-chip interconnect inductance

  • Authors:
  • Magdy A. El-Moursy;Eby G. Friedman

  • Affiliations:
  • Logic Technology Development, Intel Corporation, Hillsboro, OR and Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY;Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Year:
  • 2005

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Abstract

Interconnect inductance introduces a shielding effect which decreases the effective capacitance seen by the driver of a circuit, reducing the gate delay. A model of the effective capacitance of an load driven by a CMOS inverter is presented. The interconnect inductance decreases the gate delay and increases the time required for the signal to propagate across an interconnect, reducing the overall delay to drive an load. Ignoring the line inductance overestimates the circuit delay, inefficiently oversizing the circuit driver. Considering line inductance in the design process saves gate area, reducing dynamic power dissipation. Average reductions in power of 17% and area of 29% are achieved for example circuits. An accurate model for a CMOS inverter and an load is used to characterize the propagation delay. The accuracy of the delay model is within an average error of less than 9% as compared to SPICE.