Distributed sleep transistor network for power reduction
Proceedings of the 40th annual Design Automation Conference
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Proceedings of the 43rd annual Design Automation Conference
An analytical model for negative bias temperature instability
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Combating NBTI Degradation via Gate Sizing
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Temperature-aware NBTI modeling and the impact of input vector control on performance degradation
Proceedings of the conference on Design, automation and test in Europe
NBTI-aware synthesis of digital circuits
Proceedings of the 44th annual Design Automation Conference
An efficient method to identify critical gates under circuit aging
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
NBTI-aware sleep transistor design for reliable power-gating
Proceedings of the 19th ACM Great Lakes symposium on VLSI
NBTI-aware power gating for concurrent leakage and aging optimization
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
An efficient wakeup scheduling considering resource constraint for sensor-based power gating designs
Proceedings of the 2009 International Conference on Computer-Aided Design
The impact of NBTI effect on combinational circuit: modeling, simulation, and analysis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Aging-resilient design of pipelined architectures using novel detection and correction circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Joint logic restructuring and pin reordering against NBTI-induced performance degradation
Proceedings of the Conference on Design, Automation and Test in Europe
Minimization of NBTI performance degradation using internal node control
Proceedings of the Conference on Design, Automation and Test in Europe
NBTI-aware power gating design
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Circuit reliability: from physics to architectures
Proceedings of the International Conference on Computer-Aided Design
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Device aging, which causes significant loss on circuit performance and lifetime, has been a main factor in reliability degradation of nanoscale designs. Aggressive technology scaling trends, such as thinner gate oxide without proportional downscaling of supply voltage, necessitate an aging-aware analysis and optimization flow in the early design stages. Since PMOS sleep transistors in power-gated circuits suffer from static NBTI during active mode and age very rapidly, the aging of power-gated circuits should be explicitly addressed. In this paper, for power-gated circuits, we present a novel methodology for analyzing and mitigating NBTI-induced performance degradation. Aging effects on both logic networks and sleep transistors are jointly considered for accurate analysis. By introducing 25% redundant sleep transistors with reverse body bias applied, the proposed methodology can significantly mitigate the long-term performance degradation and thus extend the circuit lifetime by 3X.