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DAC '96 Proceedings of the 33rd annual Design Automation Conference
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Simultaneous Vt selection and assignment for leakage optimization
Proceedings of the 2003 international symposium on Low power electronics and design
Proceedings of the 2003 international symposium on Low power electronics and design
Gate sizing in MOS digital circuits with linear programming
EURO-DAC '90 Proceedings of the conference on European design automation
A Practical Transistor-Level Dual Threshold Voltage Assignment Methodology
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Linear programming for sizing, Vth and Vdd assignment
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
A new algorithm for simultaneous gate sizing and threshold voltage assignment
Proceedings of the 2009 international symposium on Physical design
Revisiting the linear programming framework for leakage power vs. performance optimization
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Strongly NP-hard discrete gate-sizing problems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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While sizing has been studied for over three decades, the absence of a common framework with which to compare methods has made progress difficult to measure. In this article, we compare popular sizing techniques in which gates are chosen from a discrete standard cell library and slew and interconnect effects are accounted for. The difference between sizing methods reduces from roughly 53% to 8% between best and worst case after slew propagation is taken into account. In our benchmarks, no one sizing technique consistently outperforms the others.