Optimal clock skew scheduling tolerant to process variations
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Storage optimization by replacing some flip-flops with latches
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Fixed-phase retiming for low power design
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
Cycle time and slack optimization for VLSI-chips
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
A methodology to improve timing yield in the presence of process variations
Proceedings of the 41st annual Design Automation Conference
Novel sizing algorithm for yield improvement under process variation in nanometer technology
Proceedings of the 41st annual Design Automation Conference
Static statistical timing analysis for latch-based pipeline designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
A yield improvement methodology using pre- and post-silicon statistical clock scheduling
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Gate sizing using incremental parameterized statistical timing analysis
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
On computing the minimum feedback vertex set of a directed graph by contraction operations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern circuit designs may suffer from design uncertainties, unpredictable in the design phase or even after manufacturing. This paper presents an optimization technique to make pipeline circuits robust against delay variations and thus maximize timing yield. By trading larger flip-flops for smaller latches, the proposed approach can be used as a post-synthesis or post-layout optimization tool, allowing accurate timing information to be available. Experimental results show an average of 31% timing yield improvement for pipeline circuits. They suggest that our method is promising for high-speed designs and is capable of tolerating clock variations.