Full-chip, three-dimensional, shapes-based RLC extraction

  • Authors:
  • K. L. Shepard;D. Sitaram;Yu Zheng

  • Affiliations:
  • Columbia University, New York, NY;Cadence Design Systems, New Providence, NJ;Columbia University, New York, NY

  • Venue:
  • Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 2000

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Abstract

In this paper, we report the development of the first commercial full-chip, three-dimensional, shapes-based, RLCK extraction tool, developed as part of a university-industry collaboration. The technique of return-limited inductances is used to provide a sparse, frequency-independent inductance and resistance network with self-inductances that represent sensible "nominal" values in the absence of mutual coupling. Mutual inductances are extracted for accurate noise analysis. The tool, Assura RLCX, exploits high-capacity scan-band techniques and disk caching for inductance extraction as an extension to Cadence's existing Assura RCX extractor.