A fast and low cost testing technique for core-based system-on-chip
DAC '98 Proceedings of the 35th annual Design Automation Conference
A framework for testing core-based systems-on-a-chip
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
Journal of Electronic Testing: Theory and Applications
Progress in Design for Test: A Personal View
IEEE Design & Test
Ten: A Concurrent Test Engineering Environment
IEEE Design & Test
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A new quality estimation methodology for mixed-signal and analogue ICs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
1.1 Test methodology for embedded cores which protects intellectual property
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Test and Debug Strategy of the PNX8525 Nexperia" Digital Video Platform System Chip
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A synthesis-for-transparency approach for hierarchical and system-on-a-chip test
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A P1500-Compatible Programmable BIST Aapproach for the Test of Embedded Flash Memories
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study
Proceedings of the conference on Design, Automation and Test in Europe - Volume 3
A System-layer Infrastructure for SoC Diagnosis
Journal of Electronic Testing: Theory and Applications
System-level testability of hardware/software systems
ITC'94 Proceedings of the 1994 international conference on Test
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