Simulating pass transistor circuits using logic simulation machines

  • Authors:
  • Z. Barzilai;L. Huisman;G. Silberman;D. Tang;L. Woo

  • Affiliations:
  • IBM Thomas J. Watson Research Center, Yorktown, New York;IBM Thomas J. Watson Research Center, Yorktown, New York;IBM Thomas J. Watson Research Center, Yorktown, New York;IBM Thomas J. Watson Research Center, Yorktown, New York;IBM Thomas J. Watson Research Center, Yorktown, New York

  • Venue:
  • DAC '83 Proceedings of the 20th Design Automation Conference
  • Year:
  • 1983

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Abstract

An algorithm for pass transistor simulation using the Yorktown Simulation Engine (YSE) is outlined. Implementing this algorithm yields an efficient tool for custom VLSI circuit design verification and fault simulation. Modeling of circuits under this environment is defined, including the analysis of the algorithm's performance for some general circuit types. A number of specific examples are discussed in detail.