A predictive distributed congestion metric and its application to technology mapping

  • Authors:
  • Rupesh S. Shelar;Sachin S. Sachin S. Sapatnekar;Prashant Saxena;Xinning Wang

  • Affiliations:
  • University of Minnesota, Minneapolis, MN;University of Minnesota, Minneapolis, MN;Intel Labs. (CAD Research), Hillsboro, OR;Intel Labs. (CAD Research), Hillsboro, OR

  • Venue:
  • Proceedings of the 2004 international symposium on Physical design
  • Year:
  • 2004

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Abstract

Due to increasing design complexity, routing congestion has become a critical problem in VLSI designs. This paper introduces a distributed metric to predict routing congestion for a premapped netlist and applies it to technology mapping that targets area optimization. Our technology mapping algorithm is guided by a probabilistic congestion map for the subject graph to identify the congested regions. Experimental results on the benchmark circuits in a 90nm technology show that congestion-aware mapping results in a reduction of 37%, on an average, in track overflows as compared to conventional technology mapping.