DAGON: technology binding and local optimization by DAG matching
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
Generic global placement and floorplanning
DAC '98 Proceedings of the 35th annual Design Automation Conference
Can recursive bisection alone produce routable placements?
Proceedings of the 37th Annual Design Automation Conference
Congestion aware layout driven logic synthesis
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
The scaling challenge: can correct-by-construction design help?
Proceedings of the 2003 international symposium on Physical design
Metrics for structural logic synthesis
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Congestion-Aware Logic Synthesis
Proceedings of the conference on Design, automation and test in Europe
Sequential synthesis using S1S
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Estimating routing congestion using probabilistic analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Global and local congestion optimization in technology mapping
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Is probabilistic congestion estimation worthwhile?
Proceedings of the 2005 international workshop on System level interconnect prediction
Proceedings of the 2005 international symposium on Physical design
An efficient technology mapping algorithm targeting routing congestion under delay constraints
Proceedings of the 2005 international symposium on Physical design
Wire length prediction-based technology mapping and fanout optimization
Proceedings of the 2005 international symposium on Physical design
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Due to increasing design complexity, routing congestion has become a critical problem in VLSI designs. This paper introduces a distributed metric to predict routing congestion for a premapped netlist and applies it to technology mapping that targets area optimization. Our technology mapping algorithm is guided by a probabilistic congestion map for the subject graph to identify the congested regions. Experimental results on the benchmark circuits in a 90nm technology show that congestion-aware mapping results in a reduction of 37%, on an average, in track overflows as compared to conventional technology mapping.