MTDT '02 Proceedings of the The 2002 IEEE International Workshop on Memory Technology, Design and Testing
SRAM Leakage Suppression by Minimizing Standby Supply Voltage
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
Design and analysis of two low-power SRAM cell structures
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
FinFET-based power simulator for interconnection networks
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Pragmatic design of gated-diode FinFET DRAMs
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Self-repairing SRAM using on-chip detection and compensation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Gated-diode FinFET DRAMs: Device and circuit design-considerations
ACM Journal on Emerging Technologies in Computing Systems (JETC)
SRAM read/write margin enhancements using FinFETs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Circuit techniques utilizing independent gate control in double-gate technologies
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Proceedings of the 48th Design Automation Conference
The ITRS design technology and system drivers roadmap: process and status
Proceedings of the 50th Annual Design Automation Conference
Design space exploration of FinFET cache
ACM Journal on Emerging Technologies in Computing Systems (JETC)
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Intrinsic variations and challenging leakage control in today's bulk-Si MOSFETs limit the scaling of SRAM. Design tradeoffs in six-transistor (6-T) and four-transistor (4-T) SRAM cells are presented in this work. It is found that 6-T and 4-T FinFET-based SRAM cells designed with built-in feedback achieve significant improvements in the cell static noise margin (SNM) without area penalty. Up to 2x improvement in SNM can be achieved in 6-T FinFET-based SRAM cells. A 4-T FinFET-based SRAM cell with built-in feedback can achieve sub-100pA per-cell standby current and offer the similar improvements in SNM as the 6-T cell with feedback, making them attractive for low-power, low-voltage applications