Fault tolerant and fault testable hardware design
Fault tolerant and fault testable hardware design
Introduction to finite fields and their applications
Introduction to finite fields and their applications
IEEE Transactions on Computers
Low-Complexity Bit-Parallel Canonical and Normal Basis Multipliers for a Class of Finite Fields
IEEE Transactions on Computers
On-Line Error Detection for Bit-Serial Multipliers in GF(2m)
Journal of Electronic Testing: Theory and Applications
IEEE Transactions on Computers
Fast Algorithms for Digital Signal Processing
Fast Algorithms for Digital Signal Processing
VLSI Designs for Multiplication over Finite Fields GF (2m)
AAECC-6 Proceedings of the 6th International Conference, on Applied Algebra, Algebraic Algorithms and Error-Correcting Codes
Error Detection in Polynomial Basis Multipliers over Binary Extension Fields
CHES '02 Revised Papers from the 4th International Workshop on Cryptographic Hardware and Embedded Systems
IEEE Transactions on Computers
Concurrent Error Detection in a Polynomial Basis Multiplier over GF(2m)
Journal of Electronic Testing: Theory and Applications
Concurrent error detection architectures for Gaussian normal basis multiplication over GF(2m)
Integration, the VLSI Journal
Journal of Signal Processing Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Concurrent error detection architectures for field multiplication using gaussian normal basis
ISPEC'10 Proceedings of the 6th international conference on Information Security Practice and Experience
Hi-index | 0.00 |
The finite field is widely used in error-correcting codes and cryptography. Among its important arithmetic operations, multiplication is identified as the most important and complicated. Therefore, a multiplier with concurrent error detection ability is elegantly needed. In this paper, a concurrent error detection scheme is presented for bit-parallel systolic dual basis multiplier over GF(2m) according to the Fenn's multiplier in [7]. Although, the proposed method increases the space complexity overhead about 27% and the latency overhead about one extra clock cycle as compared to Fenn's multiplier. Our analysis shows that all single stuck-at faults can be detected concurrently.