Low power, testable dual edge triggered flip-flops
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
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ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
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ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
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GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
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IEEE Transactions on Circuits and Systems Part I: Regular Papers
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PATMOS'10 Proceedings of the 20th international conference on Integrated circuit and system design: power and timing modeling, optimization and simulation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Low-power dual-edge triggered state retention scan flip-flop
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
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This paper describes the classification, detailed timing characterization, evaluation, and design of the dual-edge triggered storage elements (DETSE). The performance and power characterization of DETSE includes the effect of clocking at halved clock frequency and impact of load imposed by the storage element to the clock distribution network. The presented analysis estimates the timing penalty and power savings of a system based on DETSE, and gives design guidelines for high-performance and low-power application. In addition, the paper presents a class of dual-edge triggered flip-flops with clock load, delay, and internal power consumption comparable to the fastest single-edge triggered storage elements (SETSE). Our simulated results show that by halving the clock frequency, dual-edge clocking strategy can save about 50% of the power consumed by the clock distribution network, and relax the design of clock distribution system, while paying virtually no penalty in throughput.