The Weighted Syndrome Sums Approach to VLSI Testing

Authors:
Z. Barzilai;J. Savir;G. Markowsky;M. G. Smith
Affiliations:
IBM Thomas J. Watson Research Center;-;-;-
Venue:
IEEE Transactions on Computers
Year:
1981

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Abstract

With the advent of VLSI, testing has become one of the most costly, complicated, and time consuming problems. The method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation. It can also be considered as a vehicle for self-testing. In order to employ syndrome-testing in VLSI, we electronically partition the chip into macros in test mode. The macros are then syndrome tested in sequence.