Improved weight assignment for logic switching activity during at-speed test pattern generation

Authors:
M.-F. Wu;H.-C. Pan;T.-H. Wang;J.-L. Huang;Kun-Han Tsai;Wu-Tung Cheng
Affiliations:
National Taiwan University, Taipei, Taiwan;National Taiwan University, Taipei, Taiwan;National Taiwan University, Taipei, Taiwan;National Taiwan University, Taipei, Taiwan;Mentor Graphics Corporation, Wilsonville, OR;Mentor Graphics Corporation, Wilsonville, OR
Venue:
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Year:
2010

Citing 13
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Abstract

For two-pattern at-speed scan testing, the excessive power supply noise at the launch cycle may cause the circuit under test to malfunction, leading to yield loss. This paper proposes a new weight assignment scheme for logic switching activity; it enhances the IR-drop assessment capability of the existing weighted switching activity (WSA) model. By including the power grid network structure information, the proposed weight assignment better reflects the regional IR-drop impact of each switching event. For ATPG, such comprehensive information is crucial in determining whether a switching event burdens the IR-drop effect. Simulation results show that, compared with previous weight assignment schemes, the estimated regional IR-drop profiles better correlate with those generated by commercial tools.