Differential fault simulation - a fast method using minimal memory
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Proofs: a fast, memory efficient sequential circuit fault simulator
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
On efficient concurrent fault simulation for synchronous sequential circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
HOPE: an efficient parallel fault simulator for synchronous sequential circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
The concurrent simulation of nearly identical digital networks
DAC '73 Proceedings of the 10th Design Automation Workshop
HyHOPE: a fast fault simulator with efficient simulation of hypertrophic faults
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Fault emulation: a new approach to fault grading
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Quality Determination for Gate Delay Fault Tests Considering Three-State Elements
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
On Non-Statistical Techniques for Fast Fault Coverage Estimation
Journal of Electronic Testing: Theory and Applications
Proceedings of the conference on Design, automation and test in Europe
Fast fault simulation for BIST applications
ATS '95 Proceedings of the 4th Asian Test Symposium
Dynamic Fault Grouping for PROOFS: A Win for Large Sequential Circuits
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Overcoming the Serial Logic Simulation Bottleneck in Parallel Fault Simulation
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
The Effects of Test Compaction on Fault Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Serial diagnostic fault simulation for synchronous sequential circuits
Integration, the VLSI Journal
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