SAT and ATPG: algorithms for Boolean decision problems

  • Authors:
  • Wolfgang Kunz;João Marques-Silva;Sharad Malik

  • Affiliations:
  • Univ. of Frankfurt/Main, Frankfurt, Germany;Technical Univ. of Lisbon, Lisbon, Portugal;Princeton Univ., Princeton, NJ

  • Venue:
  • Logic Synthesis and Verification
  • Year:
  • 2001

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Abstract

The problems of Boolean satisfiability (SAT) and automatic test pattern generation (ATPG) are strongly related - both in terms of application areas (premanufacturing design validation and post-manufacturing testing), as well as in terms of techniques used in their practical solutions (searching large combinatorial spaces through efficient pruning). However, historically these domains have evolved somewhat independently with limited interaction. While ATPG has been primarily driven by reasoning based on circuit structure, SAT has forcussed on reasoning using conjunctive form (CNF) representations of Boolean formulas. In this chapter, we introduce these problems, describe key techniques used to solve them in practice, and highlight the common themes and differences between them.