A topological search algorithm for ATPG
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
EST: The new frontier in automatic test-pattern generation
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
An effective test generation system for sequential circuits
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
GRASP—a new search algorithm for satisfiability
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
FPGA '99 Proceedings of the 1999 ACM/SIGDA seventh international symposium on Field programmable gate arrays
GRASP: A Search Algorithm for Propositional Satisfiability
IEEE Transactions on Computers
An exact solution to the minimum size test pattern problem
ACM Transactions on Design Automation of Electronic Systems (TODAES)
SAT and ATPG: algorithms for Boolean decision problems
Logic Synthesis and Verification
New Techniques for Deterministic Test Pattern Generation
Journal of Electronic Testing: Theory and Applications
20.2 New Techniques for Deterministic Test Pattern Generation
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Static Property Checking Using ATPG v.s. BDD Techniques
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Efficient Preimage Computation Using A Novel Success-Driven ATPG
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Success-Driven Learning in ATPG for Preimage Computation
IEEE Design & Test
ATPG-based preimage computation: efficient search space pruning with ZBDD
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Verification of large scale nano systems with unreliable nano devices
Nano, quantum and molecular computing
Accurate timing analysis using SAT and pattern-dependent delay models
Proceedings of the conference on Design, automation and test in Europe
Journal of Electronic Testing: Theory and Applications
Proceedings of the 1st Amrita ACM-W Celebration on Women in Computing in India
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems
Journal of Electronic Testing: Theory and Applications
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