Verification of large scale nano systems with unreliable nano devices

Authors:
Michael S. Hsiao;Shuo Sheng;Rajat Arora;Ankur Jain;Vamsi Boppana
Affiliations:
Department of Electrical and Computer Engineering, Virginia Tech;Mentor Graphics Corporation, Wilsonville, OR;Department of Electrical and Computer Engineering, Virginia Tech;Haas School of Business, University of California at Berkeley;Zenasis Technologies
Venue:
Nano, quantum and molecular computing
Year:
2004

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Abstract

Any nano-system that designers build must guarantee functional correctness. The sheer scale factor and the added layers of uncertainty in nano-systems demand revolutionary breakthroughs in system design tools and algorithms. Formal verification of nano systems, then, must be able to deal with large state spaces, together with the presence of unknowns and uncertainties. The methods described in this chapter present a suite of algorithms that can offer potential in reducing the problem complexity in verification of nano-systems.