GRASP—a new search algorithm for satisfiability
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
GRASP: A Search Algorithm for Propositional Satisfiability
IEEE Transactions on Computers
SAT based ATPG using fast justification and propagation in the implication graph
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Circuit-based Boolean Reasoning
Proceedings of the 38th annual Design Automation Conference
Chaff: engineering an efficient SAT solver
Proceedings of the 38th annual Design Automation Conference
The Impact of Branching Heuristics in Propositional Satisfiability Algorithms
EPIA '99 Proceedings of the 9th Portuguese Conference on Artificial Intelligence: Progress in Artificial Intelligence
Robust Search Algorithms for Test Pattern Generation
FTCS '97 Proceedings of the 27th International Symposium on Fault-Tolerant Computing (FTCS '97)
The complexity of theorem-proving procedures
STOC '71 Proceedings of the third annual ACM symposium on Theory of computing
BerkMin: A Fast and Robust Sat-Solver
Proceedings of the conference on Design, automation and test in Europe
Advanced Formal Verification
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
IEEE Transactions on Computers
On the Acceleration of Test Generation Algorithms
IEEE Transactions on Computers
Diagnosis of automata failures: a calculus and a method
IBM Journal of Research and Development
Combinational test generation using satisfiability
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
SAT-based ATPG using multilevel compatible don't-cares
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Exact multiple-control toffoli network synthesis with SAT techniques
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Automatic test pattern generation
SFM'06 Proceedings of the 6th international conference on Formal Methods for the Design of Computer, Communication, and Software Systems
Improved SAT-based ATPG: more constraints, better compaction
Proceedings of the International Conference on Computer-Aided Design
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Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) has been proposed as an alternative to classical search algorithms. SAT-based ATPG turned out to be more robust and more effective by formulating the problem as a set of equations. In this paper we present an efficient ATPG algorithm that makes use of powerful SAT-solving techniques. Problem specific heuristics are applied to guide the search. In contrast to previous SAT-based algorithms, the new approach can also cope with tri-states. The algorithm has been implemented as the tool PASSAT. Experimental results on large industrial circuits are given to demonstrate the quality and efficiency of the algorithm.