Testability properties of multilevel logic networks derived from binary decision diagrams
Proceedings of the 1991 University of California/Santa Cruz conference on Advanced research in VLSI
Synthesis and optimization procedures for robustly delay-fault testable combinational logic circuits
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
A variable observation time method for testing delay faults
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Non-scan design-for-testability techniques for sequential circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
NEST: A non-enumerative test generation method for path delay faults in combinational circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Delay fault coverage and performance tradeoffs
DAC '93 Proceedings of the 30th international Design Automation Conference
An efficient non-enumerative method to estimate path delay fault coverage
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
COMPACTEST: A Method to Generate Compact Test Sets for Combinatorial Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
On synthesis-for-testability of combinational logic circuits
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
On the Number of Tests to Detect All Path Delay Faults in Combinational Logic Circuits
IEEE Transactions on Computers
Test generation for primitive path delay faults in combinational circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
9.3 Improving Path Delay Fault Testability by Path Removal
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Design for Primitive Delay Fault Testability
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Robust Testability of Primitive Faults using Test Points
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution
IEEE Transactions on Computers
Improving the transition fault coverage of functional broadside tests by observation point insertion
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Built-in generation of multicycle functional broadside tests with observation points
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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