Evaluation of FPGA resources for built-in self-test of programmable logic blocks

Testing the configurable interconnect/logic interface of SRAM-based FPGA's

DATE '99 Proceedings of the conference on Design, automation and test in Europe

SRAM-Based FPGAs: Testing the Embedded RAM Modules

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

An Approach for Detecting Multiple Faulty FPGA Logic Blocks

IEEE Transactions on Computers

An Approach to Minimize the Test Configuration for the Logic Cells of the Xilinx XC4000 FPGAs Family

Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999

Testing the Local Interconnect Resources of SRAM-Based FPGA's

Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98

RAM-based FPGA's: a test approach for the configurable logic

Proceedings of the conference on Design, automation and test in Europe

A Discussion on Test Pattern Generation for FPGA—Implemented Circuits

Journal of Electronic Testing: Theory and Applications

Testing the Interconnect of RAM-Based FPGAs

IEEE Design & Test

Letters

IEEE Design & Test

A Specific Test Methodology for Symmetric SRAM-Based FPGAs

FPL '00 Proceedings of the The Roadmap to Reconfigurable Computing, 10th International Workshop on Field-Programmable Logic and Applications

SRAM-based FPGA's: testing the LUT/RAM modules

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Analyzing the Test Generation Problem for an Application-Oriented Test of FPGAs

ETW '00 Proceedings of the IEEE European Test Workshop

Test of RAM-based FPGA: methodology and application to the interconnect

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

BIST-Based Detection and Diagnosis of Multiple Faults in FPGAs

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Different Experiments in Test Generation for XILINX FPGAs

ITC '00 Proceedings of the 2000 IEEE International Test Conference

IS-FPGA: A New Symmetric FPGA Architecture with Implicit SCAN

ITC '01 Proceedings of the 2001 IEEE International Test Conference

BIST-Based Diagnostics of FPGA Logic Blocks

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Improving On-Line BIST-Based Diagnosis for Roving STARs

IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)

Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on the 2001 international conference on computer design (ICCD)

Online BIST and BIST-based diagnosis of FPGA logic blocks

IEEE Transactions on Very Large Scale Integration (VLSI) Systems