SRAM-Based FPGAs: Testing the Embedded RAM Modules

  • Authors:
  • M. Renovell;J. M. Portal;J. Figueras;Y. Zorian

  • Affiliations:
  • LIRMM-UM2, 161 Rue Ada, 34392 Montpellier Cedex, France. renovell@lirmm.fr;LIRMM-UM2, 161 Rue Ada, 34392 Montpellier Cedex, France;UPC Diagonal, 647 Barcelona, Spain. figueras@eel.upc.es;Logic Vision Inc., 101 Metro Drive, San Jose, CA 95110, USA. zorian@lvision.com

  • Venue:
  • Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
  • Year:
  • 1999

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Abstract

This paper describes a test method for analogue (partsof) ICs that determines whether an IC is good or not bymeasuring the currents flowing through its constituent circuits.The ICCQ test method is not a full functional test. Itis aimed primarily ...