Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
Efficient implementation of a BDD package
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Heuristic minimization of BDDs using don't cares
DAC '94 Proceedings of the 31st annual Design Automation Conference
Dynamic variable ordering for ordered binary decision diagrams
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Sequential logic optimization by redundancy addition and removal
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Verification of large synthesized designs
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
HANNIBAL: an efficient tool for logic verification based on recursive learning
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Sequential Redundancy Identification Using Verification Techniques
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Advanced verification techniques based on learning
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
An efficient filter-based approach for combinational verification
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Automatic partitioning for efficient combinatorial verification
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Efficient Combinational Verification Using Overlapping Local BDDs and a Hash Table
Formal Methods in System Design
On More Efficient Combinational ATPG Using Functional Learning
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Formal Verification of Combinational Circuit
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Using ATPG for clock rules checking in complex scan designs
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
OPTIMIZING THE FLATTENED TEST-GENERATION MODEL FOR VERY LARGE DESIGNS
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A BDD-based verification method for large synthesized circuits
Integration, the VLSI Journal
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It is well known that learning (i.e., indirect implications) based techniques perform very well in many instances of combinational circuit verification when the two circuits being verified have many corresponding internal equivalent points. We present some results on combinational circuit design verification using a powerful, and highly general learning technique called functional learning. Functional learning is based on OBDDs and hence can efficiently learn novel implications based on functional manipulation.