Advanced verification techniques based on learning

  • Authors:
  • Jawahar Jain;Rajarshi Mukherjee;Masahiro Fujita

  • Affiliations:
  • Fujitsu Laboratories of America, 77 Rio Robles, San Jose CA;Fujitsu Laboratories of America, 77 Rio Robles, San Jose CA and Dept. of Electrical and Computer Engineering, University of Texas at Austin, Austin TX;Fujitsu Laboratories of America, 77 Rio Robles, San Jose CA

  • Venue:
  • DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
  • Year:
  • 1995

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Abstract