A New Approach to the Design of Testable PLA's
IEEE Transactions on Computers
On yield consideration for the design of redundant programmable logic arrays
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
On the Design of Pseudoexhaustive Testable PLAs
IEEE Transactions on Computers - Fault-Tolerant Computing
The Complexity of Generating Minimum Test Sets for PLA's and Monotone Combinational Circuits
IEEE Transactions on Computers
PLATYPUS: a PLA test pattern generation tool
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
Optimal order of the VLSI IC testing sequence
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
A New Method for Testing Re-Programmable PLAs
Journal of Electronic Testing: Theory and Applications
Test generation for programmable logic arrays
DAC '82 Proceedings of the 19th Design Automation Conference
A self-checking PLA automatic generator tool based on unordered codes encoding
EURO-DAC '91 Proceedings of the conference on European design automation
IEEE Transactions on Computers
An On-Line Algorithm for the Location of Cross Point Faults in Programmable Logic Arrays
IEEE Transactions on Computers
A Design for Testability of Undetectable Crosspoint Faults in Programmable Logic Arrays
IEEE Transactions on Computers
A heuristic test-pattern generator for programmable logic arrays
IBM Journal of Research and Development
Universal syndrome-testable design of programmable logic arrays
Integration, the VLSI Journal
Optimal logic synthesis and testability: two faces of the same coin
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
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Programmable Logic Arrays (PLA) are finding increasing use as a cost-effective means to utilize LSI electronics. In this paper, three classes of faults, namely stuck faults, shorts and cross-point defects are defined and characterized in a PLA. The relationship between the test sets and their faults among all three classes are discussed. Finally, an algorithm for generating a test set for all three classes of faults is presented.