RTL Test Justification and Propagation Analysis for Modular Designs
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Test generation for Gigahertz processors using an automatic functional constraint extractor
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Embedded hardware and software self-testing methodologies for processor cores
Proceedings of the 37th Annual Design Automation Conference
Selective-run built-in self-test using an embedded processor
Proceedings of the 12th ACM Great Lakes symposium on VLSI
Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
DFT guidance through RTL test justification and propagation analysis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A scalable software-based self-test methodology for programmable processors
Proceedings of the 40th annual Design Automation Conference
Reducing Test Application Time in High-Level Test Generation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Fast Test Generation for Circuits with RTL and Gate-Level Views
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Automatic Functional Test Generation - A Reality
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation
Journal of Electronic Testing: Theory and Applications
Software-based self-test methodology for crosstalk faults in processors
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Software-based self-test of processors under power constraints
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Simulation-Based Functional Test Generation for Embedded Processors
IEEE Transactions on Computers
Software-based self-testing with multiple-level abstractions for soft processor cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A hybrid software-based self-testing methodology for embedded processor
Proceedings of the 2008 ACM symposium on Applied computing
Testing diagnostics of modern microprocessors with the use of functional models
Automation and Remote Control
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
BLoG: post-silicon bug localization in processors using bug localization graphs
Proceedings of the 47th Design Automation Conference
PN-based formal modeling and verification for ASIP architecture
ICESS'04 Proceedings of the First international conference on Embedded Software and Systems
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