Reducing structural bias in technology mapping

  • Authors:
  • S. Chatterjee;A. Mishchenko;R. Brayton;X. Wang;T. Kam

  • Affiliations:
  • Dept. of Electr. Eng. & Comput. Sci.,, UC Berkeley, CA, USA;Dept. of Electr. Eng. & Comput. Sci.,, UC Berkeley, CA, USA;Dept. of Electr. Eng. & Comput. Sci.,, UC Berkeley, CA, USA;Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., South Korea;IBM Syst. & Technol. Group, Austin, TX, USA

  • Venue:
  • ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
  • Year:
  • 2005

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Abstract

Technology mapping based on DAG-covering suffers from the problem of structural bias: the structure of the mapped netlist depends strongly on the subject graph. In this paper we present a new mapper aimed at mitigating structural bias. It is based on a simplified cut-based Boolean matching algorithm, and using the speed afforded by this simplification we explore two ideas to reduce structural bias. The first, called lossless synthesis, leverages recent advances in structure-based combinational equivalence checking to combine the different networks seen during technology independent synthesis into a single network with choices in a scalable manner. We show how cut based mapping extends naturally to handle such networks with choices. The second idea is to combine several library gates into a single gate (called a supergate) in order to make the matching process less local. We show how supergates help address the structural bias problem, and how they fit naturally into the cut-based Boolean matching scheme. An implementation based on these ideas significantly outperforms state-of-the-art mappers in terms of delay, area and run-time on academic and industrial benchmarks.